NNT'08 (October 13-15, 2008 Kyoto International Conference Center, Kyoto ) Program |
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October 13, 2008 | |||||
Registration (2F beside Room A) (16:30-18:30) | |||||
Welcom Party (Swan, 1F) | |||||
Welcome Party (18:00-20:00) | |||||
October 14, 2008 | |||||
Registration (2F beside Room A) (8:30-18:00) | |||||
Room A | |||||
Chairpersons: Y. Hirai (Osaka Pref. Univ.), S.Y. Chou (Princeton Univ.) | |||||
Opening | |||||
Session No. | Start | End | Paper Title | Speakers | Affiliation |
9:00 | 9:05 | Opening | M. Komuro | NNT'08 Chair, NEDO, Japan | |
9:05 | 9:10 | Opening Remarks | Y. Hirai | NNT'08 Program Chair, Osaka Pref. Univ., Japan | |
14A-1: Application I | |||||
14A-1-1 | 9:10 | 9:40 | Patterned Media Fabrication with Nanoimprint Process (Plenary) | B.-K. Lee, D. Lee, E. Cho, H.-S. Kim, M.-B. Lee, J.-S. Sohn | Samsung Advanced Inst. of Technol., Korea |
14A-1-2 | 9:40 | 10:00 | Chemically Directed Block Copolymer Self-assembly for 10nm Scale Nano-Lithography (Invited) | H. Yoshida 1, Y. Tada 1, S. Akasaka 2, R. Ruiz 3, E. Dobisz 3, D. Kercher 3, M. Takenaka 2, H. Hasegawa 2, T.R. Albrecht 3 | 1 Hitachi, 2 Kyoto Univ., Japan and 3 Hitachi Global Storage Technologies, USA |
14A-1-3 | 10:00 | 10:20 | Nanomold Fabrication and Nanoimprint Anti-reflection Structures Utilized Blu-ray Disc Technology (Invited) | S. Endoh and K. Hayashibe | Sony, Japan |
14A-1-4 | 10:20 | 10:40 | 3D Visualization of Molding Filling Stages in Thermal Nanoimprint (Invited) | H. Schift 1, G. Kim 2, J.J. Lee 2, K. Vogelsang 1 and J. Gobrecht 1 | 1 Paul Scherrer Inst., Switzerland and 2 Korea Inst. of Machinery & Materials, Korea |
Chairpersons: K. Asakawa (Toshiba), H. Kurz ( Aschen Univ./AMO GmbH) | |||||
14A-2: Thermal Nanoimprint | |||||
14A-2-1 | 10:40 | 11:00 | Quantitative Strategies to Handle Stamp Bending in NIL | R.H. Pedersen 1, L.H. Thamdrup 1, A.V. Larsen 1, A. Kristensen 1 and D.-A. Mendels 2 | 1 Tech. Univ. of Denmark, Denmark and 2 Cognoscens, France |
14A-2-2 | 11:00 | 11:20 | The Imprint Software: Quantitative Prediction of Process Parameters for Successful Nanoimprint Lithography | N. Kehagias 1,2, V. Reboud 1,2, C.M. Sotomayor Torres 1,3 | 1 Campus de Bellaterra, Spain, 2 Univ. College Cork, Ireland and 3 ICREA, Spain |
14A-2-3 | 11:20 | 11:40 | A Novel Analytical Model for Thermoplastic Deformation of Resist in Thermal Nanoimprintlithography | S. Choi, I. Park and A.P. Pisano | UCLA, Berkeley, USA |
14A-2-4 | 11:40 | 12:00 | Nanoimprint of Metallic Glasses | Y. Saotome, K. Amiya, Y. Shibata, A. Makino and A. Inoue | Tohoku Univ., Japan |
Lunch (12:00-13:10) | |||||
Chairpersons: M. Komuro (NEDO), J. Guo (Univ. of Michigan) | |||||
14A-3: Production | |||||
14A-3-1 | 13:10 | 13:30 | Considerlation of Nanoimprinting for Production (Invited) | J. Ahopelto | VTT Micro & Nanoelectron., Finland |
14A-3-2 | 13:30 | 13:50 | Industrial Imprint Lithography for High Volume Manufacturing Optoelectronic (Invited) | B. Heidari | Obducat, Sweden |
Chairpersons: H. Hiroshima (AIST), C.G. Willson (Univ. of Texas) | |||||
14A-4: UV Nanoimprint | |||||
14A-4-1 | 13:50 | 14:10 | Numerical Study on Bubble Trapping in UV Nanoimprint Lithography | D. Morihara 1, H. Hiroshima 2 and Y. Hirai 1 | 1@Osaka. Pref. Univ. and 2 AIST, Japan |
14A-4-2 | 14:10 | 14:30 | Nanoimprint Lithography for Sub-10 nm Complex Patterns | W. Wu 1, Q. Xia 1, D. Morecroft 2, J. Yang 2, K.K. Berggren 2, H. Ge 3, X. Li 1, S.-Y. Wang 1 and R.S. Williams 1 | 1 Hewlett-Packard, 2 MIT, USA and 3 Nanking Univ., China |
14A-4-3 | 14:30 | 14:50 | Duplication of Mold for Nanoimprint Lithography using reworkable UV Curing Resin | H. Wakayama, K. Mitsukura, H. Okamura, K. Suyama, Y. Hirai and M. Shirai | Osaka Pref. Univ., Japan |
14A-4-4 | 14:50 | 15:10 | Fabrication of Thin Film Pua Stamps with Micro and Nano Patterns by the UV-Nanoimprint Lithography Tools | S.Y. Park, Y.J. Kim, H.S. Jang and J.J. Lee | Korea Inst. of Machinery & Materials, Korea |
Coffee Break (15:10-15:30) | |||||
POSTER SESSION (15:30-17:30) | |||||
Room B-1: Thermal Imprint / Process | |||||
14B1-5-1 | Impact of Ultrasonic Vibration on Room-Temperature Imprinting | H. Mekaru and M. Takahashi | AIST, Japan | ||
14B1-5-2 | Short-Cycle Thermal Nanoimprint using Smart Stamps | R.H. Pedersen 1, K.H. Rasmussen 1, L.V. Lorenzen 1, C.J. Luscher 1, O. Hansen 1,2 and A. Kristensen 1 | Tech. Univ. of Denmark, Denmark | ||
14B1-5-3 | Theoretical Study of Ultimate Resolution in Glass Nanoimprint Lithography | K. Tada, Y. Kimoto, M. Yasuda, H. Kawata and Y. Hirai | Osaka Pref. Univ., Japan | ||
14B1-5-4 | Fabrication of Partition Wall for Solar Cell by Hot Embossing | J.S. Kim, S.K. Hong, J.D. Kim, J.J. Kang and C.J. Hwang | Korea Inst. of Industr. Technol., Korea | ||
14B1-5-5 | Profiling of a Poly(Styrene) Residual Layer in Hot Emboss using a mm-scale Mold by a Reflective Thickness Monitor | K. Nagase and M. Nakagawa | Tokyo Inst. of Technol., Japan | ||
14B1-5-6 | Fracture Mechanism of Glass Forming using Imprinting Process | Y.M. Hung and C.K. Sung | Natl. Tsing Hua Univ., Taiwan | ||
14B1-5-7 | Gold Nanowires Imprinted by Hot-Embossing on Parylene-C/Polyimide and Hydrogen Silsesquioxane | C.-C. Hsu, L.-W. Cheng and F.-S. Huang | Natl. Tsing Hua Univ., Taiwan | ||
14B1-5-8 | Contact Angles in Thermal Imprint | N. Bogdanski, S. Mollenbeck and H.-C. Scheer | Univ. of Wuppertal, Germany | ||
14B1-5-9 | Importance of Mold Pattern Profile and Resist Thickness for Demording Force | M. Matsue, K. Kubo, H. Kawata, M. Yasuda and Y. Hirai | Osaka Pref. Univ., Japan | ||
14B1-5-10 | Process Time in Glass Nanoimprint | Y. Kimoto 1, M. Shibata 1, T. Mori 2, H. Kasa 3, J. Nishii 3 and Y. Hirai 1 | 1 Osaka Pref. Univ., 2 Konica Minolta Opto and 3 AIST, Japan | ||
14B1-5-11 | Impact of Process Conditions Temperature on Adhesion and Friction Forces in Thermal NIL | T. Tanabe 1, D. Jarzabek 2, M. Matsue 1, H. Kawata 1, Z. Rymuza 2 and Y. Hirai 1 | 1 Osaka Pref. Univ., Japan and 2 Warsaw Univ. of Technol., Poland | ||
14B1-5-12 | Process and Polymer Design for Rapid Thermal NIL | M. Shibata, T. Tanabe, H. Kawata and Y. Hirai | Osaka Pref. Univ., Japan | ||
Room B-1: Thermal Imprint / Material | |||||
14B1-5-14 | Imprint and Pattern Transfer of Silica Sol-Gel Resist: A Powerful Nanofabrication Approach | C. Peroz 1,2, A. Chang 2, B. Harteneck 2, S. Dhuey 2, D. Olynick 2 and S. Cabrini 2 | 1 Abeam Technol. and 2 The Molecular Foundry, USA | ||
14B1-5-15 | Gas Phase Deposition of Anti-Sticking Layers for NIL | H.-C. Scheer, A. Fidler, W. Hafner, S. Mollenbeck and N. Bogdanski | Univ. of Wuppertal, Germany | ||
14B1-5-16 | Rheological Characterisation and Tuning of Polymers for Nanoimprint Lithography | I.G. Romero, F. Reuther, M. Fink and G. Gruetzner | Micro Resist Technol., Germany | ||
14B1-5-17 | Low Temperature Imprinting of Polyimide and Carbon Nanotube Composites with the Assistance of Residual Solvents and Precursor Material | E. Itoh, S. Tamura, K. Ishiyama, Y. Sano and K. Miyairi | Shinshu Univ., Japan | ||
14B1-5-18 | Photo-Induced Chemisorption of Poly(Styrene) Resist Suppressing Partial Filling in Thermal Nanoimprint Lithography | H. Oda 1, T. Ohtake 2, T. Takaoka 2 and M. Nakagawa 1 | 1 Tokyo Inst. of Technol.. and 2 NOF, Japan | ||
Room B-1: Tools | |||||
14B1-5-19 | Examination of a Floor Cushion Process which Improves Residual Film Thickness Uniformity | A. Sekiguchi 1, Y. Kono 1 and Y. Hirai 2 | 1 Litho Tech Japan Corp. and 2 Osaka Pref. Univ., Japan | ||
14B1-5-20 | Development of a Microcontact Printer for A4-sized Sheets | H. Fujita 1,2, M. Nagae 1,2, T. Takahashi 2, H. Mogi 1,3, H. Ushijima 4 and K. Yase 4 | 1 Japan Chemical Innovation Inst., 2 Dai Nippon Printing and 3 Shin-Etsu Chemical and 4 AIST, Japan | ||
Room B-1: Application Strage & Electronics | |||||
14B1-5-21 | NIL Mold for Bit Patterned Media Fabricated by Block Copolymer Template | H. Hieda, N. Kihara and K. Naito | Toshiba, Japan | ||
14B1-5-22 | Template Replication using a Tone-Reversal Imprint Process for Patterned Magnetic Recording Media | H. Wang, Z. Yu, M. Feldbaum, N. Kurataka, Y. Hsu, G. Gauzner, D. Weller, D. Kuo and K. Lee | Recording Media Operations, USA | ||
14B1-5-23 | Control of Location, Diameter, Length, and Orientation of Si Nanowire Grown on Amorphous Substrate Using Nanoimprint Lithography and Novel Catalysts | C. Wang, P. Murphy and S.Y. Chou | Princeton Univ., USA | ||
14B1-5-24 | Resistance Random Access Memory Fabricated by Nanoimprint Lithography | H. Jung, H. Choi, J. Yoon, H. Hwang and G-Y. Jung | Gwangju Inst. of Sci. and Technol., Korea | ||
14B1-5-25 | Fabrication of a-Si Nano-Wires using UV Nano-Imprint Lithography and its Crystallization Characteristics | G. Nakagawa and T. Asano | Kyushu Univ., Japan | ||
14B1-5-26 | One Step Printing of Multiple Biomolecules using a Nanostructured Macrostamp | Jean-Christophe Cau 1, Franck Carcenac 1, Nathalie Marsaud 2, Helene Lalo 1, Veronique Leberre 2, Jean-Pierre Peyrade 1, Jean-Marie Francois 2 and Christophe Vieu 1 | 1 Toulouse Univ. and 2 Genopole Toulouse, France | ||
14B1-5-27 | Nanoimprint Lithography: A General Tool for the Fabrication of (Bio)Functional Assemblies: Study Case Light Harvesting Antenna Complexes | M. Escalante 1, Y. Zhao 1, M.J.W. Ludden 1, R. Vermeij 1, J.D. Olsen 2, E. Berenschot 1, C.N. Hunter 2, J. Huskens 1, V. Subramaniam 1 and C. Otto 1 | 1 Univ. of Twente, The Netherlands and 2 Univ. of Sheffield, UK | ||
14B1-5-28 | Roll-to-Roll Processing of Fluidics Channels on Plastic Web | T. Makela 1,2, T. Haatainen 1, P. Majander 1 and J. Ahopelto 1 | 1 VTT Micro & Nanoelectron. and 2 Abo Akademi Univ., Finland | ||
Room B-1: Soft Lithography | |||||
14B1-5-29 | PDMS Molding for High-Aspect-Ratio Subwavelength Microstructures | Y.-Y. Su 1, S.-J. Lin 1, M.-K. Wei 1, W.-L. Lai 2, H.-Y. Lin 2, J.-H. Tsai 2 and T.-C. Wu 2 | 1 Natl. Dong Hwa Univ. and Industr. Technol. Res. Inst., Taiwan | ||
14B1-5-30 | Local Work Function Control of Indium Tin Oxide by Micro Contact Printing | T. Watanabe and M. Fujihira | Tokyo Inst. of Technol., Japan | ||
14B1-5-31 | Molecular Patterns Produced by Soft Lithography using PDMS Stamps with Self-Organized Surface Features | H. Lalo 1,2 and C. Vieu 1 | 1Toulouse Univ. and 2 Parc dfacticite Activestre, France | ||
14B1-5-32 | Fabrication of 3D Structures by Micro Contact Printing on Topography | I. Bergmair 1,2, M. Muhlberger 1, W. Schwinger 1, K. Hingerl 2, R. Schoftner 1 | 1 Profactor and 2 CD Lab. of Surface Optics, Austria | ||
14B1-5-33 | Printing of Catalytic Nano-Particles for CNT-Growth | W. Schwinger 1, I. Bergmair 1, M. Muhlberger 1, M. Bodnarchuk 2,3, M. Kovalenko 2,3, R. Haubner 4, E. Lausecker 1,5, W. Heiss 3 and R. Schoftner 1 | 1 Profactor, Austria, 2 Univ. of Chicago, USA, 3 Johannes Kepler Univ., Austria, 4 Tech. Univ. Vienna, Austria and 5 Princeton Univ., USA | ||
14B1-5-34 | The Direct Nano-Patterning Method of ZnO using Nanoimprint Lithography with ZnO-Sol and Thermal Annealing Process | K.-Y. Yang, K.-M. Yoon and H. Lee | Korea Univ., Korea | ||
14B1-5-35 | Replication of Dot-like Arrowhead Structures | S. Mollenbeck 1, N. Bogdanski 1, H.-C. Scheer 1, J. Zajadacz 2 and K. Zimmer 2 | 1 Univ. of Wuppertal and 2 Leibniz Inst. for Surface Modification, Germany | ||
Room B-1: Mold | |||||
14B1-5-36 | Large Area Seamless Quarts Mold by Scanner Lithography | T. Isano, Y. Kaneda, K. Asano and T. Hoshi | Canon, Japan | ||
14B1-5-37 | Ni-Nanostructured Mold with Atmosphere Plasma Surface Treatment for Roller Nanoimprint | F.-Y. Chang 1,2, T.-L. Chang 1, W.-L. Lai 1, Y.-J. Huang 1, T.-H. Chou 1, H.-P. Yang 1, C.-W. Chen 1, C.-J. Wu 1, H.-Y. Lin 1 and J.-H. Tsai 1 | 1 Industr. Technol. Res. Inst. and 2 Natl. Taiwan Univ. of Sci. & Technol., Taiwan | ||
14B1-5-38 | Imprint Mask Infrastructure for the 32nm Node and Beyond | K. Selinidis, E. Thompson, G. Schmid, J. Maltabes, I. McMackin, N. Stacey, S.V. Sreenivasan and D.J. Resnick, | Molecular Imprints, USA | ||
14B1-5-39 | Si Mold Fabrication with Extremely High Aspect Pattern by the Combination of Deep Rie and Koh Treatment | H. Kawata, K. Kubo, M. Matsue, M. Yasuda and Y. Hirai | Osaka Pref. Univ., Japan | ||
14B1-5-40 | Large Area Mold Fabrication by Electron-Beam Stepper | M. Okada 1, T. Kishiro 2, K. Yanagihara 2, M. Ataka 2, N. Anazawa 2 and S. Matsui 1 | 1 Univ. of Hyogo and 2 Holon, Japan | ||
14B1-5-41 | Antisticking Layer Formed by CHF3 Plasma Irradiation for Nanoimprint Molds | M. Okada 1, K. Nakamatsu 1,2, Y. Kang 1, K. Kanda 1, Y. Haruyama 1 and S. Matsui 1 | 1 Univ. of Hyogo and 2 JSPS, Japan | ||
14B1-5-42 | Room Temperature Nanoimprinting on a Release Agent Coated Hydrogen Silsesquioxane | M. Okada 1, M. Iwasa 2, K. Nakamatsu 1, 3, Y. Kang 1, K. Kanda 1, Y. Haruyama 1 and S. Matsui 1 | 1 Univ. of Hyogo, 2 SII NanoTechnol. and 3 JSPS, Japan | ||
14B1-5-43 | Fabrication of Wavy Grating Microstructures | S.-J. Lin 1, Y.-Y. Su 1, M.-K. Wei 1, W.-L. Lai 2, H.-Y. Lin 2, J.-H. Tsai 2 and T.-C. Wu 2 | 1 Natl. Dong Hwa Univ. and 2 Industr. Technol. Res. Inst., Taiwan | ||
14B1-5-44 | On the Degradation of Anti-Sticking Layers during Nanoimprint Lithography | R. Galand 1, D. Boutry 1, A. Beaurain 1, A. Francone 1, B. Pelissier 1, M. Zelsmann 1, B. Pepin-Donat 2 and J. Boussey 1 | 1 LTM-CNRS and 2 LEMOH, France | ||
14B1-5-45 | Preparation Methods and Characteristics of Fluorinated Polymers for Mold Replication | K. Tsunozaki and Y. Kawaguchi | Asahi Glass, Japan | ||
14B1-5-46 | Stitching Free High Resolution Stamps for Molding Techniques with EUV Interference Lithography | M. Bednarzik 1, M. Saidani 1, B. Keusch 2, H. Solak 3, H. Schift 1, C. Spreu 1 and J. Gobrecht 1 | 1 Paul Scherrer Inst., 2 INKA Inst. of Polymer Nanotechnology and 3 EULITHA AG, Switzerland | ||
14B1-5-47 | Fabrication of Nanopatterned Conducting Polymer on Flexible Substrate by Reversal Nanoimprint | J. Lee, D.-G. Choi, A. O. Altun, K.-D. Kim, J.-H. Choi, S.-W. Lee, K.-J. Lee, E.-S. Lee and J.-H. Jeong | Korea Inst. of Machinery & Materials, Korea | ||
Room B-2: Nanoimprint General | |||||
14B2-5-48 | Quantized-Patterning Using Nanoimprinted-Blanks (QUN) | W.-D. Li, X. Liang and S.Y. Chou | Princeton Univ., USA | ||
14B2-5-49 | The Analysis of Residual Layer Thickness in Roll Pressing Imprint Lithography | Y.T. Cho, J.G. Kim, J.W. Cho, J.W. Seo, S. Kwon, Y.S. Sim, S.W. Lee and H. Kim | Samsung Electro., Korea | ||
14B2-5-50 | Direct Nanoimprinting of Gold Film for Fabricating Metallic Gratings | J.]N. Aoh | Natl. Chung Cheng Univ., Taiwan | ||
14B2-5-51 | Fabrication of High Aspect Si Structures by Deep Reactive Ion Etching using Nanoimprinted HSQ Masks | K. Nakamatsu 1,2 and S. Matsui 1 | 1 Univ. of Hyogo and 2 JSPS, Japan | ||
14B2-5-52 | Fabrication of Silver Nanoparticle Arrays based on the Combination of NIL and Electrochemical Deposition | B. Yang 1, N. Lu 1, D. Qi 1, H. Xu 1 and L. Chi 1,2 | 1 Jilin Univ., China, and 2 Westfalische Wilhelms-Univ. Munster, Germany | ||
14B2-5-53 | Controlled Growth of Metal Oxide Nanowires via Nanoimprinting-based Patterning of Nanoparticle Seeds | I. Park, S.H. Ko, S. Choi. Costas, P. Grigoropoulos and A.P. Pisano | UCLA, Berkeley, USA | ||
14B2-5-54 | Nanofabrication of ITO Film by Room-Temperature Nanoimprint | Y. Kang 1, M. Okada 1, K. Nakamatsu 1,2, K. Kanda 1, Y. Haruyama 1 and S. Matsui 1 | 1 Univ. of Hyogo and 2 JSPS, Japan | ||
14B2-5-55 | Nanolithography Using Photocatalytic Decomposition of Organic Films | K. Kobayashi, Y. Tomita, Y. Maeda and Y. Khono | Shizuoka Univ., Japan | ||
Room B-2: UV Imprint / Process | |||||
14B2-5-56 | Theoretical and Experimental Evaluation of Flowing Behaviour of Spin Coated UV?NIL Materials | A. Francone 1, C. Iojoiu 2, P. Voisin 1, C. Gourgon 1, D. Boutry 1, M. Zelsmann 1 and J. Boussey 1 | 1 MINATEC and 2 Physicochimie des Materiaux et des Interfaces, France | ||
14B2-5-57 | Multi-Layer Alignment by UV-Imprint Process using Water Soluble Resist | D.-I. Lee, S.-U. Jung and S.-U. Kwak | Kornic Systems, Korea | ||
14B2-5-58 | Soft UV-NIL Enables Industrial Applications | T. Glinsner 1, G. Kreindl 1, A. Malzer 1, R. Fodisch 1, P. Lindner 1, M. Wimplinger 1 and R. Miller 2 | 1 EVGroup and 2 EVGroup Inc., USA | ||
14B2-5-59 | Realization of Nanoholes by Soft UV Nanoimprint Lithography for the Study of Membrane Proteins | F. Hamouda, E. Laille, G. Barbillon, G. Agnus, P. Gogol, D. Bouville, T. Maroutian, and B. Bartenlian | Univ. Paris-Sud, France | ||
14B2-5-60 | UV Step and Stamp Imprint Lithography using Transparent Polymer Stamp | T. Haatainen 1, P. Majander 2, T. Makela 3, J. Ahopelto 1, Y. Kawaguchi 2 and G. Lecarpentier 3 | 1 VTT Micro & Nanoelectron., Finland, 2 Asahi Glass, Japan and 3 Smart Equipment Technol. SAS, France | ||
14B2-5-61 | High-Thorghput Nano-Metal Patterning Process using UV Nanoimprint Lithography and Electrodeposition | H. Shinohara, Jun M. and S. Shoji | Waseda Univ., Japan | ||
14B2-5-62 | A 3D Micropatterning for Cylindrical Microcirruits based on UV Imprinting Combined with PDMS Molding Process | D.K. Lee, S.W. Youn, I. Terada, T. Itoh, M. Takahashi and R. Maeda | AIST, Japan | ||
Room B-2: UV Imprint / Material | |||||
14B2-5-63 | Photocurable Silsesquioxane Resists for Nanoimprint Lithography | C. Pinaa 1, L. J. Guo 1 and P.-F. Fu 2 | 1 Univ. of Michigan and 2 Dow Corning, USA | ||
14B2-5-64 | UV-NIL using Working Stamps made from Ormostamp | M. Muhlberger 1, I. Bergmair 1, A. Klukowska 2, A. Kolander 2, H. Leichtfried 1, E. Platzgummer 3, H. Loeschner 3, Ch. Ebm 3, G. Grutzner 2 and R. Schoftner 1 | 1 Profactor, Austria, 2 Micro Resist Technol. and 3 IMS Nanofabrication, Germany | ||
14B2-5-65 | Plasma Etching Behaviour of Photocured Nanoimprint Resists | D. Boutry, J. De Girolamo, X. Mellhaoui, M. Zelsmann and J. Boussey | LTM-CNRS, France | ||
14B2-5-66 | Functionality and Etch Selectivity of Direct UV Imprinted Patterns onto Nanosilver Colloid-Dispersed Resists | J.-H. Choi, S.-W. Lee, J.-H. Jeong, D.-G. Choi, K.-D. Kim and E.-S. Lee | Korea Inst. of Machinery & Materials, Korea | ||
Room B-2: Application / Optics | |||||
14B2-5-67 | Materials and Patterns Shape Selection Processes by NIL on Transparent Substrates for Optical Application | N. Chaix 1, C. Gourgon 1, C. Perret 1, S. Landis 2, V. Lambertini 3, N.L. Pira 3 | 1 LTM-CNRS, 2 Minatec, France and 3 FIAT, Italy | ||
14B2-5-68 | Optical Nanoimprint using Plastic Template and Visible Light-Curable Photopolymer | N. Fujii 1, S. Moriyama 2, H. Kawata 1, M. Komai 2 and Y. Hirai 1 | 1 Osaka Pref. Univ. and 2 Kyowa Hakko Chemical, Japan | ||
14B2-5-69 | Fabrication of Artificial Butterfly Wings Nanostructures: Iridescence and Restricted Viewing Angle Effects | T.S. Kustandi, H.Y. Low, J.H. Teng, I. Rodriguez and R. Yin | A*STAR, Singapore | ||
14B2-5-70 | Resolution of Subwavelength Diffraction for Critical Dimension Metrology | T. Kehoe 1,2, V. Reboud 1, B. McCarthy 2 and C.M. Sotomayor Torres 1,3 | 1 Campus Univ. Autonoma de Barcelona, Spain, 2 Univ. College Cork, Ireland and ICREA, Spain | ||
14B2-5-71 | Alignment of Liquid Crystals at Functional Patterns Prepared by Nanoimprint Lithography | T.N. Oo 1, M. Yoneya 2, Y. Mitsuhashi 1 and H. Yokoyama 2 | 1 Japan Sci. & Technol. Agency and 2 AIST, Japan | ||
14B2-5-72 | Effect of Dual Side Patterning and Imprint Materials in the Fabrication of Antireflective Structure using Nanoimprint | D.-G. Choi, K.-J. Lee, K.-D. Kim, J. Lee, J.-H. Choi, E.-S. Lee and J.-H. Jeong | Korea Inst. of Machinery & Materials, Korea | ||
14B2-5-73 | Imprinted Optical Elements with High Efficiency for Liquid Crystal Displays | Y.-W. Lim, W. Lee and S.-D. Lee | Seoul Natl. Univ., Korea | ||
14B2-5-74 | Analysis Simulation for Black Matrix Correction of Deformities Process Optimization | J.-S. An , S.-U. Jung and S.-U. Kwak | Kornic Systems, Korea | ||
14B2-5-75 | Fabrication of Anti-Reflection Film by Imprinting Processes with AAO Template | H.M. Chen 1, M.H. Hon 1, and I.C. Leu 2 | 1 Natl. Cheng-Kung Univ. and 2 Natl. United Univ., Taiwan | ||
14B2-5-76 | Antireflection Structures by Nanoimprinting using Anodic Porous Alumina Molds | T. Yanagishita 1,2, T. Endo 1, K. Nishio 1,2 and H. Masuda 1,2 | 1 Tokyo Metropol. Univ. and 2 Kanagawa Academy of Sci. & Technol., Japan | ||
14B2-5-77 | Fabrication and Characterization of Metallic Nanocavities by Nanoimprint Lithography | J. Shi 1, J. Chen 1, D. Decanini 1, Y. Chen 2 and A.-M. Haghiri-Gosnet 1 | 1 Lab. de Photonique et de Nanostructures and 2 Ecole Normale Superieure de Paris, France | ||
14B2-5-78 | Fabrication of Artificial Compound Eyes with Combined Microscale and Nanoscale Topography by Soft Embossing Technique | J.-H. Chang, C.-S. Jao, Y.-P. Chen, S.-J. Chiu and L.A. Wang | Natl. Taiwan Univ., Taiwan | ||
Banquet (Sakura, 1F) | |||||
Banquet (18:00-20:00) Event: Dance of Kyoto by MAIKO |
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October 15, 2008 | |||||
Registration (beside Room A) (8:30-16:30) | |||||
Chairpersons: M. Komuro (NEDO), B.-K. Lee (Samsung Advanced Inst. of Technol.) | |||||
15A-6: Application II | |||||
15A-6-1 | 9:00 | 9:30 | Nanoimprint Applications on CMOS Devices (Plenary) | T. Nakasugi | Toshiba, Japan |
15A-6-2 | 9:30 | 10:00 | Large Area UV Nanoimprint Lithography for TFT-LCD Devices (Plenary) | J. Bae, B. Kim, J. Chang and S. Lim | Samsung Electronics, Korea |
15A-6-3 | 10:00 | 10:20 | A Nanogap Detector Inside Nanofluidic Channel for Fast Real-Time Label-Free DNA Analysis Using Multiple Nanoimprint Lithography (Invited) | X. Liang and S.Y. Chou | Princeton Univ., USA |
Chairpersons: A. Yokoo (NTT), L.A. Wang (National Taiwan Univ.) | |||||
15A-7: Application III | |||||
15A-7-1 | 10:20 | 10:40 | Self-Aligned Multilevel Molds for Top-Gate Fet Fabrication using Imprint Lithography | E. Lausecker 1,2, Y. Huang 1, S. Wagner 1 and J. C. Sturm 1 | 1 Princeton Univ., USA and 2 Univ. of Linz, Austria |
15A-7-2 | 10:40 | 11:00 | GHz Band Surface Acoustic Wave Filter Fabrication by UV-Nanoimprint | N.-H. Chen 1, C.-L. Liao 1, H.J.H. Chen 2 and F.-S. Huang 1 | 1 Natl. Tsing Hua Univ. and 2 Natl. Chi Nan Univ., Taiwan |
15A-7-3 | 11:00 | 11:20 | Patterned Media using Step and Flash Imprint Lithography | D.J. Resnick 1, M. Miller 1, G. Schmid 1, C. Brooks 1, N. Khusnatdinov 1, D. LaBrake 1, S.V. Sreenivasan 1, G. Gauzner 2, K. Lee 2, D. Kuo 2 and D. Weller 2 | 1 Molecular Imprints and 2 Seagate Technol., USA |
15A-7-4 | 11:20 | 11:40 | Imprinting Process for a Large Area Pattern Transferring on Light-Emitting Diodes Structure to Improve Light Extraction | K.-J. Byeon 1, E.-J. Hong 1, S.-H. Hong 1, S.-Y. Hwang 1, C.-H. Hong 2 and H. Lee 1 | 1 Korea Univ. and 2 Chonbuk Natl. Univ., Korea |
15A-7-5 | 11:40 | 12:00 | Metallic Nanoparticules Enhanced the Spontaneous Emission of Semiconductor Nanocrystals Embedded in Nanoimprinted Photonic Crystals | V. Reboud 1,6, N. Kehagias 1,6, M. Striccoli 3, T. Placido 3, A. Panniello 4, M.L. Curri 3, M. Zelsmann 2, J.A. Alducin 5, D. Mecerreyes 5, S. Newcomb 7, H. Doyle 6, G. Redmond 6 and C.M. Sotomayor Torres 1,7 | 1 Catalan Inst. of Nanotechnol., Spain, 2 LTM-CNRS, France, 3 Sezione Bari, Italy, 5 Nanogune-Consolider & CIDETEC-Centre for Electrochemical Technol., Spain, 6 Univ. College Cork, Ireland, 7 Newport, Ireland and 8 ICREA, Spain |
15A-7-6 | 12:00 | 12:20 | Roll-to-Roll Thermal Nanoimprinted Microfluidic Sdparation Devices | A.V. Larsen 1, T. Makela 2, P. Majander 2, J. Ahopelto 2 and A. Kristensen 1 | 1 Tech. Univ. of Denmark, Denmark and 2 VTT Micro & Nanoelectron., Finland |
Lunch (12:20-13:20) | |||||
Chairpersons: M. Houga (DNP), D.J. Resnick (Molecular Imprints) | |||||
15A-8: Mold Technology | |||||
15A-8-1 | 13:20 | 13:40 | Capacity-Equalized Mold for Nanoimprint Lithography | H. Hiroshima | AIST, Japan |
15A-8-2 | 13:40 | 14:00 | Si-Mold Fabrication Process by using High-Resolution Chemically Amplified Resist | M. Ishikawa, T. Chiba, M. Fukuda, M. Kurihara, H. Sano and M. Hoga | Dai Nippon Printing, Japan |
15A-8-3 | 14:00 | 14:20 | Characterization of UV-Cured Nanoimprint Resist ? Metallic Release Layer Systems | F.A. Houle, D.L. Casher, D.C. Miller, S. Raoux and E. Simonyia | IBM, USA |
15A-8-4 | 14:20 | 14:40 | Nanoimprint-Soft Lithography combined Mold with Ultra-Thin Rigid Patterning Layer on Elastic Support | Z. Li 1, H. Ge 1, W. Wu 2, Q. Xia 2, C. Yuan 1 and Y. Chen 1 | 1 Nanjing Univ., China and 2 Hewlett-Packard Lab., USA |
15A-8-5 | 14:40 | 15:00 | Nanoscale Releas Effect Measurement of Antisticking Layer for Nanoimprint Resin by Scanning Probe Microscope | M. Okada 1, M. Iwasa 2, K. Nakamatsu 1,3, Y. Kang 1, K. Kanda 1, Y. Haruyama 1 and S. Matsui 1 | 1 Univ. of Hyogo, 2 SII Nanotechnol. and 3 JSPS, Japan |
15A-8-6 | @@Withdrawn | ||||
Coffee Break (15:00-15:20) | |||||
Chairpersons: S. Matsui (Univ. of Hyogo), J. Ahopelto (VTT Micro & Nanoelectron) | |||||
15A-9: Process & Tools | |||||
15A-9-1 | 15:20 | 15:40 | Imprinting Fine Structures on Non-planar Surfaces and their Applications (Invited) | L.A. Wang | National Taiwan Univ., Taiwan |
15A-9-2 | 15:40 | 16:00 | Applications of Non-Conventional Nanoimprint Lithography (Invited) | K-Y Yang, S-H Hong, K-J Byeon, K-S Han and H. Lee | Korea Univ., Korea |
15A-9-3 | 16:00 | 16:20 | Reversal ƒÊCp using Hard Stamps for the Fabrication of Negative Index Materials | I. Bergmair 1,2, M. Muhlberger 1, W. Schwinger 1, K. Hingerl 2, R. Schoftner 1 | 1 Profactor and 2 CD Lab. of Surface Optics, Austria |
15A-9-4 | 16:20 | 16:40 | Can Sub-5nm Full-Field Overlay be Achieved using Imprint Lithography? | P.D. Schumaker, A. Cherala, B. Mokaberi-Nezhad, M. Meissl, B.J. Choi and S.V. Sreenivasan | Molecular Imprints, USA |
15A-9-5 | 16:40 | 17:00 | Large-Area Continuous Roll-to-Roll and Roll-to-Plate Nanoimprinting on Flexible and Rigid Substrates | S.H. Ahn and L.J. Guo | Univ. of Michigan, USA |
Closing | |||||
17:00 | 17:05 | Closing | S. Matsui | NNT'08 Co-Chair, Univ. of Hyogo, Japan | |
Copyright(c) Since 2007, The 7th Nanoimprint and Nanoprint Technology Conference |